Region 1

Join us for Photonics in Practice, a one-day workshop bringing together scientists, researchers, and enthusiasts from diverse backgrounds to delve into the practical side of photonics research. This event will focus on the tools, equipment, and methodologies that drive photonics research forward, exploring both experimental achievements and the challenges encountered in the field. Workshop Highlights: - Knowledge Exchange: Engage with fellow scientists and share experiences on the instrumentation, techniques, and best practices that define experimental photonics. - Hands-On Insight: Gain valuable insights into the latest tools and methodologies used in photonics, enhancing your own research skills. - Collaborative Discussion: Discover new approaches to overcoming research challenges and expanding your network within the photonics community. - Photonics Laboratory Shared Facility Tour: Experience a guided tour of the ASRC Photonics Laboratory Shared Facility, showcasing the cutting-edge instruments and resources available for advanced photonics research. Whether you're an early-career researcher, an experienced scientist, or simply curious about photonics, you're welcome to attend. If you’d like to present your work, please email [email protected] to express your interest. Registration is open to all levels—don't miss this chance to enhance your knowledge and connect with the photonics research community! [] Co-sponsored by: Advanced Science Research Center - the Graduate Center - City University of New York Agenda: Final Schedule - 09:50 – 10:00 | Opening Remarks, Viktoriia Rutckaia, Advanced Science Research Center, CUNY - 10:00 – 10:30 | Keynote: Adam Overvig, Stevens Institute of Technology - 10:30 – 10:45 | Pietro Baldin, Politecnico di Milano & EssilorLuxottica Smart Eyewear Lab, Italy - 10:45 – 11:05 | Industry: Gizelle Fonte Evilsizer, Andor, Oxford Instruments - 11:05 – 11:15 | Coffee Break - 11:15 – 11:45 | Keynote: Dorthe Eisele, City College of New York, CUNY - 11:45 – 12:00 | John Woods, Advanced Science Research Center, CUNY - 12:00 – 12:15 | Lin Jing, Advanced Science Research Center, CUNY - 12:15 – 12:30 | Hao Wang, New York University - 12:30 – 13:50 | Lunch Break - 13:50 – 14:20 | Keynote: Vinod Menon, City College of New York, CUNY - 14:20 – 14:35 | Romain Tirole, Advanced Science Research Center, CUNY - 14:35 – 14:50 | Michele Guizzardi, Advanced Science Research Center, CUNY - 14:50 – 15:05 | Coffee Break - 15:05 – 15:35| Keynote: Euclides Almeida, Queens College, CUNY - 15:35 – 15:45 | Arash Nemati, Advanced Science Research Center, CUNY - 15:45 – 16:00 | Siedah Hall, Advanced Science Research Center, CUNY - 16:00 – 16:15 |Di Zhang, Advanced Science Research Center, CUNY - 16:15 – 17:00 | Facility Tour, Closing Remarks Room: Auditorium, Bldg: Advanced Science Research Center CUNY, 85 St. Nicholas Terrace, New York, New York, United States, NY 10031

NJ Coast Life Member Lunchtime Talk - D-Day: Engineering Contributions. The Second Battle of Monmouth - the RADAR war. An ocean away from the beaches of Normandy, military installations in nearly every shore town contributed secret intelligence, counter intelligence, preparations and equipment to the success in Normandy. Talk by Fred Carl, InfoAge Science and History Museums. Lunch included so please register as soon as possible. Speaker(s): , Fred Carl Agenda: Gather at 11:30 AM: Lunch Lunch and Talk: 12 Noon to 2 PM Bldg: InfoAge Science and History Museums, 2201 Marconi Rd., Wall Township, New Jersey, United States, 07719

Reliability of Metal Gate / High-K CMOS devices 4PM Monday, Nov 11, 2024 Golisano Hall - GOL 1710/20/30 (Cybersecurity Wing) Andreas Kerber, PhD IEEE Senior Member and Distinguished Lecturer e-mail: [email protected] Abstract: Aggressively scaled transistor technologies with metal gate/high-k stacks encounter additional reliability challenges beside bias temperature instability (BTI) in PMOS and NMOS devices, time dependent dielectric breakdown and hot carrier degradation. Time-zero variability and variability induced by device aging is a growing concern which needs to be modeled using stochastic processes. The physical nature of the stochastic process remains under debate and to support model development efforts large statistical data sets are essential. In addition, self-heating during reliability testing can be observed in novel device structures like bulk FinFET, SOI FinFETs, FDSOI and gate-all-around devices and needs proper attention. Furthermore, to increase the confidence in the discrete device reliability models, device-to-circuit correlations need to be established. In this presentation we discuss how to obtain stochastic BTI data for discrete SRAM and logic device beyond 3s, address device-to-circuit correlations using ring-oscillators and explore self-heating effects in FinFET and SOI devices. Speaker(s): Dr. Andreas Kerber, Room: GOL 1710/20/30 , Bldg: Golisano Hall / Cybersecurity Wing, Rochester Institute of Technology, Rochester, New York, United States, 14623